ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,868, issued on July 14, was assigned to Sony Semiconductor Solutions Corp. (Kanagawa, Japan). "Comparator, light detection element, and ele... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,869, issued on July 14, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "In-situ reflectometry for real-time selectivity moni... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,870, issued on July 14, was assigned to California Institute of Technology (Pasadena, Calif.). "Ultra-miniature spatial heterodyne spectrom... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,871, issued on July 14, was assigned to TONGJI UNIVERSITY (Shanghai) and NATIONAL INSTITUTE OF METROLOGY, CHINA (Beijing). "Methods and dev... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,872, issued on July 14, was assigned to National Tsing Hua University (Hsinchu, Taiwan). "Two-dimensional hyperspectral imaging system and ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,873, issued on July 14, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Light detection device" was invented by Ryo Imai (Tokyo) and Taka... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,874, issued on July 14, was assigned to X-RITE Inc. (Grand Rapids, Mich.). "Validation of displays for displaying reference colors" was inv... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,875, issued on July 14, was assigned to NEC Corp. (Tokyo). "Chart, manufacturing method, determination system, determination method, and re... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,876, issued on July 14, was assigned to Seiko Epson Corp. (Tokyo). "Colorimetric apparatus and adjustment method" was invented by Masayoshi... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,877, issued on July 14, was assigned to President and Fellows of Harvard College (Cambridge, Mass.). "Systems and methods of imaging polari... Read More